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Semiconductor devices. Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (externally induced) Ingestion-build-59651 as excited by slamming
Semiconductor devices. Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (externally induced) Ingestion-build-59651 as excited by slamming
$142.00
Description
as excited by slamming
BS EN ISO 948:2009 is an International Standard which specifies a method of sampling spices and condiments
power-driven
It aims to establish operationally efficient safety equipment and systems that play a positive role during a fire emergency
BS EN 1997-1:2004+A1:2013 Eurocode 7
Semiconductor devices. Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (externally induced) Ingestion-build-59651 as excited by slamming1 Scope and object This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. NOTE This test is identical to the test method contained in 1. 2 of chapter 4 of IEC 60749
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