Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-264231 Developing and implementing a BCM

Developing and implementing a BCM response

they are decisive for the possible applications of the material

BS EN 1303:2015 supersedes BS EN 1303:2005

ISO 965-2 and ISO 3506-1

This part of ISO/TR 10064 applies to bevel gear components as defined in ISO 17485

Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-264231 Developing and implementing a BCM1 Scope This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.